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A rapid method for determining the top and bottom surface intersections of a line defect in thin foils

✍ Scribed by J.K. Kivilahti; V.K. Lindroos

Book ID
107827899
Publisher
Elsevier Science
Year
1974
Weight
278 KB
Volume
7
Category
Article
ISSN
0026-0800

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## Abstract A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Γ… is presented. This method is based on the observation of Kossel‐MΓΆllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐MΓΆllenstedt method in electron diff