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A Procedure for Calculation of the Density of States of Wide-Gap Semiconductors and Dielectrics by Means of the Recursion Method

✍ Scribed by F. Ortega; E. Caselli; M. Lester; R. Wainschenker

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
190 KB
Volume
201
Category
Article
ISSN
0370-1972

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