A precision capacitance cell for measurement of thin film out-of-plane expansion. III. Conducting and semiconducting materials

✍ Scribed by Snyder, C.R.; Mopsik, F.I.

• Book ID: 114544990
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 105 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.963185