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Broad-band microwave characterization of bilayered materials using a coaxial discontinuity with applications for thin conductive films for microelectronics and material in air-tight cell

✍ Scribed by Belhadj-Tahar, N.; Meyer, O.; Fourrier-Lamer, A.


Book ID
114552836
Publisher
IEEE
Year
1997
Tongue
English
Weight
331 KB
Volume
45
Category
Article
ISSN
0018-9480

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