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A pragmatic approach to automatic test generation and failure isolation of analog systems

✍ Scribed by Fuh-Lin Wang; Schreiber, H.

Book ID: 117914129
Publisher: IEEE
Year: 1979
Weight: 290 KB
Volume: 26
Category: Article
ISSN: 0098-4094
DOI: 10.1109/tcs.1979.1084655

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