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A possible error in a measurement of critical voltage in a high voltage electron microscope

✍ Scribed by Martin, D. G.


Book ID
114497887
Publisher
International Union of Crystallography
Year
1972
Tongue
English
Weight
234 KB
Volume
5
Category
Article
ISSN
0021-8898

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An in situ nanoindentation specimen hold
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We describe in detail, the design, construction, and testing of a specimen holder that allows for the nanoindentation of surfaces while viewing in cross-section in a high voltage transmission electron microscope (TEM). This nanoindentation specimen holder, having three-axis position control of a dia