Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates

✍ Scribed by Tamotsu Ohno; Masaya Sengoku; Tatsuo Arii

• Book ID: 108480874
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 250 KB
• Volume: 33
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/s0968-4328(01)00023-3