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A pitfall in accelerated life testing

โœ Scribed by W. R. Allen


Publisher
John Wiley and Sons
Year
1963
Tongue
English
Weight
138 KB
Volume
10
Category
Article
ISSN
0894-069X

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A nonparametric approach to accelerated
โœ Karthik Devarajan; Nader Ebrahimi ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 235 KB ๐Ÿ‘ 2 views

Accelerated life testing (ALT) is concerned with subjecting items to a series of stresses at several levels higher than those experienced under normal conditions so as to obtain the lifetime distribution of items under normal levels. A parametric approach to this problem requires two assumptions. Fi