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A Pearson Effective Potential for Monte Carlo Simulation of Quantum Confinement Effects in nMOSFETs

โœ Scribed by Jaud, M.-A.; Barraud, S.; Saint-Martin, J.; Bournel, A.; Dollfus, P.; Jaouen, H.


Book ID
114619203
Publisher
IEEE
Year
2008
Tongue
English
Weight
653 KB
Volume
55
Category
Article
ISSN
0018-9383

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