A parallel-vector concurrent-fault simulator and generation of single-input-change tests for path-delay faults

✍ Scribed by Gharaybeh, M.A.; Bushnell, M.L.; Agrawal, V.D.

• Book ID: 119778368
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 140 KB
• Volume: 17
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.720322