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A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection

โœ Scribed by Badar-ud-din Ahmed, Wang Youren, Rizwan Ullah, Najam-ud-din Ahmed


Book ID
118800840
Publisher
Springer US
Year
2012
Tongue
English
Weight
236 KB
Volume
28
Category
Article
ISSN
0923-8174

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