A novel technique for X-ray laser beam characterization
โ Scribed by T. Afshar-rad; O. Willi
- Publisher
- Springer
- Year
- 1990
- Tongue
- English
- Weight
- 623 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0721-7269
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
We have investigated the damaging effects of a femtosecond pulsed laser beam with 400 nm wavelength on a Mo/Si EUV multilayer. The exposures have been done in vacuum with multiple pulses (5 pulses/mm 2 ) of 120 fs varying the laser fluence in the 38-195 mJ/cm 2 range. The analysis of the different i
A chamber for observation in situ of polarized total-reflection fluorescence extended X-ray absorption fine structure (PTRF-XAFS) spectra was constructed, which makes it possible to measure the PTRF-XAFS spectra in situ under preparation, treatment, and reaction conditions from high vacuum( 1 ร 10 9