A Novel Stress Characterization Techniqu
A Novel Stress Characterization Technique for the Development of Low-Stress Ohmic Contacts to HgCdTe
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D. DβOrsogna; P. Lamarre; E. Bellotti; P. E. Barbone; F. Smith; C. Fulk; P. LoVe
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Article
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2009
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Springer US
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English
β 710 KB