A Novel Stress Characterization Technique for the Development of Low-Stress Ohmic Contacts to HgCdTe

✍ Scribed by D. D’Orsogna; P. Lamarre; E. Bellotti; P. E. Barbone; F. Smith; C. Fulk; P. LoVecchio; M. B. Reine; S. P. Tobin; J. Markunas

• Book ID: 107455505
• Publisher: Springer US
• Year: 2009
• Tongue: English
• Weight: 710 KB
• Volume: 38
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-009-0790-7