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A novel sensor for ion electron emission microscopy

✍ Scribed by Dario Bisello; Marco Dal Maschio; Piero Giubilato; Alexander Kaminsky; Massimo Nigro; Devis Pantano; Riccardo Rando; Mario Tessaro; Jeffery Wyss


Book ID
113823026
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
476 KB
Volume
219-220
Category
Article
ISSN
0168-583X

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At the INFN Legnaro Laboratories (Padova, Italy), an ion electron emission microscope dedicated to the study of radiation-induced damage in microelectronic devices has been recently installed. It is used to recognize, with micrometric resolution, the impact point of every single ion into the target.

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