A new focused ion beam optical system that uses a liquid metal ion source was designed for a new secondary ion time-of-flight mass spectrometry instrument. This optical system consists mainly of two electrostatic lenses. The axial performance of the system was calculated to decide the design values
A novel scheme for the time-of-flight analysis of extended ion packets
โ Scribed by Eugene Moskovets; Akos Vertes
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 78 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0951-4198
No coin nor oath required. For personal study only.
โฆ Synopsis
A new scheme is proposed for providing enhanced time-of-flight focusing of spatially extended ion packets moving with close to uniform velocity, sufficiently high for reliable ion detection. The arrangement consists of two decelerating regions with homogeneous electric fields similar to the two-stage ion reflector. The decelerating field in the first decelerating stage is created in a pulsed fashion after the ion packet has entered the first region. The effect of fringe fields produced by shielding rings and the microchannel plate detector is discussed.
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