A novel method to separately investigate program and erase degradation mechanisms in flash memory cells

✍ Scribed by Tseng, J.M.Z.; Larsen, B.J.; Yang Xiao; Erickson, D.A.

• Book ID: 114538983
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 139 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.974734