A Novel Method of MOSFET Series Resistance Extraction Featuring Constant Mobility Criteria and Mobility Universality

✍ Scribed by Da-Wen Lin; Ming-Lung Cheng; Shyh-Wei Wang; Chung-Cheng Wu; Ming-Jer Chen

• Book ID: 114619931
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 774 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2041508