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A novel method for the determination of the radiation damage effects in silicon detectors

✍ Scribed by M. Acciarri; S. Acerboni; S. Binetti; S. Ferrari; S. Pizzini; M. Bosetti; G.P. Rancoita; M. Rattaggi; G. Terzi

Book ID
113392532
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
280 KB
Volume
32
Category
Article
ISSN
0920-5632

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