𝔖 Bobbio Scriptorium
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A microscopic explanation for type inversion and the annealing behaviour of radiation damaged silicon detectors

✍ Scribed by J. Matheson; M. Robbins; S. Watts; G. Hall; B. MacEvoy


Book ID
107923207
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
357 KB
Volume
371
Category
Article
ISSN
0168-9002

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