A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals

[ACM Press the 39th conference - New Orl

[ACM Press the 39th conference - New Orleans, Louisiana, USA (2002.06.10-2002.06.14)] Proceedings of the 39th conference on Design automation - DAC '02 - A novel wavelet transform based transient current analysis for fault detection and localization

✍ Bhunia, Swarup; Roy, Kaushik; Segura, Jaume 📂 Article 📅 2002 🏛 ACM Press 🌐 English ⚖ 202 KB

Sponsored By Acm ... [et Al.]. Cover Title. Acm Order Number 477020 ; Ieee Catalog Number 02ch37324--t.p. Verso. Includes Bibliographical References And Author Index. Also Available On The World Wide Web Via Acm Digital Library With Title: Proceedings Of The 39th Conference On Design Automation, 200