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A Novel Extraction Method and Compact Model for the Steepness Estimation of FDSOI TFET Lateral Junction

✍ Scribed by Dan, S.S.; Biswas, A.; Le Royer, C.; Grabinski, W.; Ionescu, A.M.

Book ID: 119799643
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 382 KB
Volume: 33
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2011.2174027

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