Bayesian reliability analysis using the
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Ian F. Somerville; Duane L. Dietrich; Thomas A. Mazzuchi
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Article
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1997
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Elsevier Science
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English
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This paper examines Bayesian analysis as a tool for predicting both reliability growth and reliability of censored multi-level, multi-stress accelerated life tests. The methodology is examined using the Dirichlet prior distribution in reliability growth applications and in randomly ordered accelerat