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A nonparametric-Bayes reliability-growth model : David Robinson and Duane Dietrich. IEEE Trans. Reliab. 38(5), 591 (1989)

Book ID: 103283051
Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 131 KB
Volume: 31
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(91)90416-5

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