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A quasi-Bayes estimate of the failure intensity of a reliability-growth model : J. J. Higgins and C. P. Tsokos. IEEE Trans. Reliab.R-30 (5), 471 (1981)

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 129 KB
Volume: 23
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(83)91403-8

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