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A non-destructive optical technique for testing lacquered metal surfaces

✍ Scribed by J.P.G. Farr; J.M. Keen; M.D. Pettitt


Publisher
Elsevier Science
Year
1973
Weight
546 KB
Volume
1
Category
Article
ISSN
0300-9416

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New spectroscopic ellipsometry techniques are very promising for the non-destructive surface analysis of thin films on metals. Infrared spectroscopic ellipsometry allows the morphological and chemical characterization of these films, and recent results are presented here.