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A non-destructive method for determination of thermal conductivity of YSZ coatings deposited on Si substrates

✍ Scribed by C. Amaya; J.C. Caicedo; J.M. Yáñez-Limón; R.A. Vargas; G. Zambrano; M.E. Gómez; P. Prieto

No coin nor oath required. For personal study only.

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