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Thermal Conductivity Measurement of Submicron-Thick Films Deposited on Substrates by Modified ac Calorimetry (Laser-Heating Ångstrom Method)

✍ Scribed by R. Kato; A. Maesono; R. P. Tye


Book ID
110294831
Publisher
Springer
Year
2001
Tongue
English
Weight
196 KB
Volume
22
Category
Article
ISSN
0195-928X

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