𝔖 Bobbio Scriptorium
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A new test for monopoly with limited cost data

✍ Scribed by Charles C. Moul


Book ID
119232158
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
196 KB
Volume
117
Category
Article
ISSN
0165-1765

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## Abstract It is common to use ATPG of scan‐based design for high fault coverage in LSI testing. However, significant increases in test cost arise with increasing design complexity. Recent strategies for test cost reduction combine ATPG and BIST techniques. Unfortunately, these strategies have ser