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A New Technique for the Determination of the Critical Current Density in Superconducting Films and Flat Samples

✍ Scribed by McLoughlin, Conor; Bernstein, Pierre; Thimont, Yohann; Siejka, J.

Book ID
119953580
Publisher
Springer
Year
2012
Tongue
English
Weight
301 KB
Volume
26
Category
Article
ISSN
0896-1107

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