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A new technique for measuring MOSFET inversion layer mobility

✍ Scribed by Huang, C.-L.; Faricelli, J.V.; Arora, N.D.

Book ID: 114535142
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 520 KB
Volume: 40
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.214740

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