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A new technique for characterization of the "End" resistance in modulation-doped FET's

✍ Scribed by Kwyro Lee; Shur, M.S.; Valois, A.J.; Robinson, G.Y.; Zhu, X.C.; van der Ziel, A.


Book ID
114594875
Publisher
IEEE
Year
1984
Tongue
English
Weight
468 KB
Volume
31
Category
Article
ISSN
0018-9383

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