A new structure and its analytical model for the electric field and breakdown voltage of SOI high voltage device with variable-k dielectric buried layer

✍ Scribed by Xiaorong Luo; Bo Zhang; Zhaoji Li

• Book ID: 108271562
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 653 KB
• Volume: 51
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2007.01.034