A new structure and its analytical breakdown model of high voltage SOI device with Step Unmovable Surface Charges of buried oxide layer

✍ Scribed by Yufeng Guo; Zhaoji Li; Bo Zhang; Xiaorong Luo

• Book ID: 107502544
• Publisher: SP Science Press
• Year: 2006
• Tongue: English
• Weight: 334 KB
• Volume: 23
• Category: Article
• ISSN: 0217-9822
• DOI: 10.1007/s11767-004-0164-5