A thermodynamic model for the growth of
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E. Schroer; S. Hopfe; J.-Y. Huh; U. GΓΆsele
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Article
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1996
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Elsevier Science
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English
β 302 KB
A thermodynamic model is derived which describes the growth kinetics of the Buried Oxide (BOX) layer in Silicon On Insulator (SOI) structures due to the oxidation of the superficial silicon layer. The model is based on the assumptions that this oxidation induces a supersaturation of interstitial oxy