A new power cycling technique for accelerated reliability evaluation of plated through holes and interconnects in PCBs

✍ Scribed by Munikoti, R.; Dhar, P.

• Book ID: 117872774
• Publisher: IEEE
• Year: 1990
• Tongue: English
• Weight: 886 KB
• Volume: 13
• Category: Article
• ISSN: 0148-6411
• DOI: 10.1109/33.62531