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A new power cycling technique for accelerated reliability evaluation of plated through holes and interconnects in PCBs : Ramachandra Munikoti and Pulak Dhar. IEEE Trans. Compon. Hybrids mfg Technol.13(4), 865 (1990)


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
133 KB
Volume
31
Category
Article
ISSN
0026-2714

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