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A new pinched-off cold-FET method to determine parasitic capacitances of FET equivalent circuits

✍ Scribed by Yeong-Lin Lai; Kuo-Hua Hsu

Book ID: 114554137
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 209 KB
Volume: 49
Category: Article
ISSN: 0018-9480
DOI: 10.1109/22.939921

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