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A New Model to Describe the Variation of Electrical Conductivity in Materials Sintered in Solid Phase

โœ Scribed by Jernot, J. P. ;Chermant, J. L. ;Coster, M.

Publisher
John Wiley and Sons
Year
1982
Tongue
English
Weight
450 KB
Volume
74
Category
Article
ISSN
0031-8965

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A ยจibrating metallic conical probe has been used in near-field microscopic measurements to obtain optical resolutions much smaller than the waยจelength. Numerical simulations of these complex problems haยจe drawn most of the attention in the past. We propose here an analytical expression for the elect