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A new model for computation of probabilistic testability in combinational circuits

✍ Scribed by Sharad C. Seth; Vishwani D. Agrawal

Book ID
107920161
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
30 KB
Volume
7
Category
Article
ISSN
0167-9260

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## Abstract A probabilistic model is developed for studying the problem of routing printed circuits. The model, which uses the density of blockages on the carrier as a parameter, is based on the path‐searching mechanism of Lee's algorithm. Lee's algorithm is used in our analysis because it belongs