✦ LIBER ✦

A new method for thin-film thickness measurement using PIXE

✍ Scribed by J. Miranda; A. Oliver; E.C. Montenegro

Book ID: 113279521
Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 530 KB
Volume: 43
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(89)90039-6

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A new method of thin-film thickness meas

A new method of thin-film thickness measurement using radioisotope Auger electrons

✍ Chizuo Moria; Jun Koike; Tamaki Watanabe 📂 Article 📅 1974 🏛 Elsevier Science ⚖ 408 KB

Multilayer thin film thickness measureme

Multilayer thin film thickness measurement using sensitivity separation method

✍ Xing-zhi Gong; Liang Cheng; Fei-hong Yu 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 793 KB

This paper, for the first time, proposed a new sensitivity separation (SS) method for measuring thicknesses of multilayer thin-film stack with high efficiency and accuracy. Through the analysis of the relationship between the film parameters and the mean misfit error (MSE), a parameter called sensit

A simple inexpensive method for thicknes

A simple inexpensive method for thickness measurement of thin films

✍ E Sader 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 119 KB

A New X-Ray Diffraction Method for Thin

A New X-Ray Diffraction Method for Thin Film Thickness Estimation

✍ Hejdová, H. ;Čermák, M. 📂 Article 📅 1982 🏛 John Wiley and Sons 🌐 English ⚖ 155 KB

IOTA, a new computer controlled thin fil

IOTA, a new computer controlled thin film thickness measurement tool

✍ K.L. Konnerth; F.H. Dill 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 802 KB

Simple method for determination of the t

Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement

✍ Luňáček, Jiři ;Hlubina, Petr ;Luňáčková, Milena 📂 Article 📅 2009 🏛 The Optical Society 🌐 English ⚖ 289 KB