Pulsed force mode: a new method for the
β
Krotil, Hans-Ulrich; Stifter, Thomas; Waschipky, Hanka; Weishaupt, Klaus; Hild,
π
Article
π
1999
π
John Wiley and Sons
π
English
β 460 KB
π 2 views
Scanning force microscopy is extended by the pulsed force mode from simple imaging of topography to measuring elastic, electrostatic and adhesive sample properties. Lateral forces are virtually eliminated so that mapping of delicate samples with high resolution in air and Γuids is easily possible. S