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A new method for surface analysis of crystals using X-ray diffraction under the specular reflection conditions

✍ Scribed by Aleksandrov, P. A. ;Afanas'ev, A. M. ;Golovin, A. L. ;Imamov, R. M. ;Novikov, D. V. ;Stepanov, S. A.

No coin nor oath required. For personal study only.

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