Obtaining quantitative information on amorphous layer thickness on crystal surface using X-ray diffraction under specular reflection conditions

✍ Scribed by Golovin, A. L. ;Imamov, R. M.

• Publisher: John Wiley and Sons
• Year: 1983
• Tongue: English
• Weight: 222 KB
• Volume: 80
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210800161