𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A new method for high-resolution measurement of semiconductor laser linewidth in coherent optical systems

✍ Scribed by Gysel, P.; Staubli, R.K.

Book ID
119784983
Publisher
IEEE
Year
1989
Tongue
English
Weight
178 KB
Volume
1
Category
Article
ISSN
1041-1135

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

A new method of noncontact measurement f
A new method of noncontact measurement for 3D micro pattern in semiconductor wafer: implementing a new optical probe
✍ H.J Pahk; W.J Ahn πŸ“‚ Article πŸ“… 2001 πŸ› Elsevier Science 🌐 English βš– 149 KB

In this paper, a new type of noncontact/nondestructive measuring method has been developed, comprising a new optical probe, precision stages, and controllers. The new optical probe has been designed using the reflected slit beam through the optical window. The optical measurement system has been imp