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A new method for determining the sharpness of InGaAs/GaAs heterojunctions by auger depth profiling

✍ Scribed by M. N. Drozdov; V. M. Danil’tsev; Yu. N. Drozdov; O. I. Khrykin; V. I. Shashkin


Book ID
110128406
Publisher
SP MAIK Nauka/Interperiodica
Year
2001
Tongue
English
Weight
53 KB
Volume
27
Category
Article
ISSN
1063-7850

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