✦ LIBER ✦

A new method for detecting electromigration failure in VLSI metallization

✍ Scribed by Rodbell, K.P.; Shatynski, S.R.

Book ID: 114594694
Publisher: IEEE
Year: 1984
Tongue: English
Weight: 196 KB
Volume: 31
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1984.21506

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