Image registration in electron microscop
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Bonnet, No�l ;Liehn, Jean-Claude
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Article
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1988
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Wiley (John Wiley & Sons)
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English
⚖ 631 KB
The geometric registration of two electron microscopic images generally is performed by maximizing the cross-correlation coefficient between them. We show that a new similarity measure (the number of sign changes) is useful for performing simultaneously geometric and gray-level registration. This me