๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A new floating resistor for CMOS technology

โœ Scribed by Singh, S.P.; Hansom, J.V.; Vlach, J.


Book ID
114559835
Publisher
IEEE
Year
1989
Weight
307 KB
Volume
36
Category
Article
ISSN
0098-4094

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


A CMOS floating resistor
โœ G. Wilson; P.K. Chan ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 201 KB
Effects of electrical and temperature st
โœ Kong-Beng Thei; Hung-Ming Chuang; Sheng-Fu Tsai; Chun-Tsen Lu; Xin-Da Liao; Kuan ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 592 KB

The effects of electrical and temperature stress on polysilicon resistors for CMOS technology applications are studied. Under a fixed square number, the peak current density (J peak ) is increased with decreasing the polysilicon resistor width W . The time-to-fail value of the polysilicon resistor i