๐”– Bobbio Scriptorium
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A new electrostatic discharge failure mode

โœ Scribed by Woods, M.H.; Gear, G.


Book ID
114592931
Publisher
IEEE
Year
1979
Tongue
English
Weight
621 KB
Volume
26
Category
Article
ISSN
0018-9383

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Electrostatic discharge failure factor o
โœ Kouichi Suzuki; Tetsuo Muranoi; Manabu Takeuchi ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 276 KB ๐Ÿ‘ 2 views

The electrostatic discharge (ESD) sensitivities of highly refined ULSIs should be evaluated by a test method based on the direct-charging charged device model (D-CDM) or the field-induced charged device model (F-CDM). The CDM features nanosecond transient response and high peak current, as compared